Optical diffraction applied to electron microscopy. A model of diffractometer and image processing unit.
DOI:
https://doi.org/10.20344/amp.4384Abstract
The analysis of images obtained in the electron microscope is made mostly through subjective mechanisms, using the observers experience to recognize morphologic patterns which will allow the identification of the structures. The development of techniques allowing a quantitative evaluation of certain parameters (eg. the volume of cell components, quantitative autoradiography, electronprobe microanalysis, etc.) made an important contribution toward the interpretation of electron micrographs. Amongst those techniques optical diffraction, using the coherent light properties of diffraction and interference, are of paramount importance.
Downloads
Downloads
How to Cite
Issue
Section
License
All the articles published in the AMP are open access and comply with the requirements of funding agencies or academic institutions. The AMP is governed by the terms of the Creative Commons ‘Attribution – Non-Commercial Use - (CC-BY-NC)’ license, regarding the use by third parties.
It is the author’s responsibility to obtain approval for the reproduction of figures, tables, etc. from other publications.
Upon acceptance of an article for publication, the authors will be asked to complete the ICMJE “Copyright Liability and Copyright Sharing Statement “(http://www.actamedicaportuguesa.com/info/AMP-NormasPublicacao.pdf) and the “Declaration of Potential Conflicts of Interest” (http:// www.icmje.org/conflicts-of-interest). An e-mail will be sent to the corresponding author to acknowledge receipt of the manuscript.
After publication, the authors are authorised to make their articles available in repositories of their institutions of origin, as long as they always mention where they were published and according to the Creative Commons license.
